TY - JOUR
T1 - VUV and Soft-X-Ray Photoemission Studies of Electronic and Atomic Structures of Metal-Overlayers on Silicon Surfaces
AU - Kono, S.
AU - Enta, Y.
AU - Abukawa, T.
AU - Nakamura, N.
AU - Anno, K.
AU - Suzuki, S.
PY - 1990/1/1
Y1 - 1990/1/1
N2 - Electronic and atomic structures of ordered metal-overlayers on Si(111) and Si(001) surfaces have been investigated by angle-resolved photoelectron spectroscopy. In the VUV photon energy region, angle-resolved photoemission has given us information about surface-state dispersion, and in the soft x-ray region, angle-resolved photoemission has given us information about surface atomic geometry. Metal overlayers treated are those of elements in the periodic table of Columns Ia, Ib, IIIb, IVb, IVb/Vb and VIb; surface orders treated are 3 × 3 on the Si(111) surface and 2 × 1 on the Si(001) surface.
AB - Electronic and atomic structures of ordered metal-overlayers on Si(111) and Si(001) surfaces have been investigated by angle-resolved photoelectron spectroscopy. In the VUV photon energy region, angle-resolved photoemission has given us information about surface-state dispersion, and in the soft x-ray region, angle-resolved photoemission has given us information about surface atomic geometry. Metal overlayers treated are those of elements in the periodic table of Columns Ia, Ib, IIIb, IVb, IVb/Vb and VIb; surface orders treated are 3 × 3 on the Si(111) surface and 2 × 1 on the Si(001) surface.
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U2 - 10.1088/0031-8949/1990/T31/013
DO - 10.1088/0031-8949/1990/T31/013
M3 - Article
AN - SCOPUS:84918214007
SN - 0031-8949
VL - 1990
SP - 96
EP - 102
JO - Physica Scripta
JF - Physica Scripta
IS - T31
ER -