Wavefront measurement for a hard-X-ray nanobeam using single-grating interferometry

Satoshi Matsuyama; Hikaru Yokoyama; Ryosuke Fukui; Yoshiki Kohmura; Kenji Tamasaku; Makina Yabashi; Wataru Yashiro; Atsushi Momose; Tetsuya Ishikawa; Kazuto Yamauchi

doi:10.1364/OE.20.024977

Wavefront measurement for a hard-X-ray nanobeam using single-grating interferometry

Satoshi Matsuyama, Hikaru Yokoyama, Ryosuke Fukui, Yoshiki Kohmura, Kenji Tamasaku, Makina Yabashi, Wataru Yashiro, Atsushi Momose, Tetsuya Ishikawa, Kazuto Yamauchi

Research output: Contribution to journal › Article › peer-review

51 Citations (Scopus)

Abstract

Wavefront measurement for a hard-X-ray nanobeam using single-grating interferometry based on the Talbot effect and the Fourier transform method was demonstrated in the 1-km-long beamline of SPring-8. 10 keV X-rays were one-dimensionally focused down to 32 nm using a total-reflection elliptical mirror. An intentionally distorted wavefront was generated using a deformable mirror placed just upstream of the focusing mirror. The wavefront measured by interferometry was cross-checked with the phase retrieval method using intensity profiles around the beam waist. Comparison of the obtained wavefront errors revealed that they are in good agreement with each other and with the wavefront error estimated from the shape of the deformable mirror at a ∼0.5 rad level.

Original language	English
Pages (from-to)	24977-24986
Number of pages	10
Journal	Optics Express
Volume	20
Issue number	22
DOIs	https://doi.org/10.1364/OE.20.024977
Publication status	Published - 2012 Oct 22

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abstract = "Wavefront measurement for a hard-X-ray nanobeam using single-grating interferometry based on the Talbot effect and the Fourier transform method was demonstrated in the 1-km-long beamline of SPring-8. 10 keV X-rays were one-dimensionally focused down to 32 nm using a total-reflection elliptical mirror. An intentionally distorted wavefront was generated using a deformable mirror placed just upstream of the focusing mirror. The wavefront measured by interferometry was cross-checked with the phase retrieval method using intensity profiles around the beam waist. Comparison of the obtained wavefront errors revealed that they are in good agreement with each other and with the wavefront error estimated from the shape of the deformable mirror at a ∼0.5 rad level.",

author = "Satoshi Matsuyama and Hikaru Yokoyama and Ryosuke Fukui and Yoshiki Kohmura and Kenji Tamasaku and Makina Yabashi and Wataru Yashiro and Atsushi Momose and Tetsuya Ishikawa and Kazuto Yamauchi",

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AU - Matsuyama, Satoshi

AU - Yokoyama, Hikaru

AU - Fukui, Ryosuke

AU - Kohmura, Yoshiki

AU - Tamasaku, Kenji

AU - Yabashi, Makina

AU - Yashiro, Wataru

AU - Momose, Atsushi

AU - Ishikawa, Tetsuya

AU - Yamauchi, Kazuto

PY - 2012/10/22

Y1 - 2012/10/22

N2 - Wavefront measurement for a hard-X-ray nanobeam using single-grating interferometry based on the Talbot effect and the Fourier transform method was demonstrated in the 1-km-long beamline of SPring-8. 10 keV X-rays were one-dimensionally focused down to 32 nm using a total-reflection elliptical mirror. An intentionally distorted wavefront was generated using a deformable mirror placed just upstream of the focusing mirror. The wavefront measured by interferometry was cross-checked with the phase retrieval method using intensity profiles around the beam waist. Comparison of the obtained wavefront errors revealed that they are in good agreement with each other and with the wavefront error estimated from the shape of the deformable mirror at a ∼0.5 rad level.

AB - Wavefront measurement for a hard-X-ray nanobeam using single-grating interferometry based on the Talbot effect and the Fourier transform method was demonstrated in the 1-km-long beamline of SPring-8. 10 keV X-rays were one-dimensionally focused down to 32 nm using a total-reflection elliptical mirror. An intentionally distorted wavefront was generated using a deformable mirror placed just upstream of the focusing mirror. The wavefront measured by interferometry was cross-checked with the phase retrieval method using intensity profiles around the beam waist. Comparison of the obtained wavefront errors revealed that they are in good agreement with each other and with the wavefront error estimated from the shape of the deformable mirror at a ∼0.5 rad level.

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Wavefront measurement for a hard-X-ray nanobeam using single-grating interferometry

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