Weissenberg reflection high-energy electron diffraction for surface crystallography

Tadashi Abukawa, Tomoyuki Yamazaki, Kentaro Yajima, Koji Yoshimura

Research output: Contribution to journalArticlepeer-review

18 Citations (Scopus)


The principle of a Weissenberg camera is applied to surface crystallographic analysis by reflection high-energy electron diffraction. By removing inelastic electrons and measuring hundreds of patterns as a function of sample rotation angle, kinematical analysis can be performed over a large volume of reciprocal space. The data set is equivalent to a three-dimensional stack of Weissenberg photographs. The method is applied to analysis of an Si(111)-3×3-Ag surface, and the structural data obtained are in excellent agreement with the known atomic structure.

Original languageEnglish
Article number245502
JournalPhysical Review Letters
Issue number24
Publication statusPublished - 2006


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