Abstract
To observe the difference of atomic heights between the Se and Te layers with respect to the Fe layer in FeSe0.4Te0.6 single crystal, a Fe Kα fluorescence X-ray holography (XFH) experiment was performed at room temperature. The crystal structure of superconductor FeSe0.4Te0.6 obtained by X-ray diffraction (XRD) at a low temperature has distinct z-coordinates of Se and Te, remarkably different from each other. The reconstructed atomic image around central Fe atoms by XFH, however, reveals the different and complex results.
Original language | English |
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Pages (from-to) | 489-498 |
Number of pages | 10 |
Journal | Zeitschrift fur Physikalische Chemie |
Volume | 230 |
Issue number | 4 |
DOIs | |
Publication status | Published - 2016 Apr 28 |
Keywords
- Atomic Image
- Chalcogen Height
- FeSeTe
- Local Atomic Structure
- Positional Fluctuations
- Superconductor
- X-ray Fluorescence Holography
ASJC Scopus subject areas
- Physical and Theoretical Chemistry