X-ray fluorescence holography of 0.078 wt% copper in silicon steel

Kouichi Hayashi, Tetsutaro Hayashi, Yukio Takahashi, Shigeru Suzuki, Eiichiro Matsubara

Research output: Contribution to journalConference articlepeer-review

7 Citations (Scopus)


X-ray fluorescence holograms of 0.078 wt% Cu in silicon steel were measured at a synchrotron radiation facility, SPring-8. The present fluorescent X-ray detection system combining a toroidally bent graphite analyzer and an avalanche photodiode enables us to record high-quality holograms by eliminating a strong Fe fluorescence from the sample. The reconstructed atomic image around Cu shows a bcc lattice, which indicates the presence of Cu in an α-Fe lattice.

Original languageEnglish
Pages (from-to)192-195
Number of pages4
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Issue number1-4
Publication statusPublished - 2005 Aug
EventSynchrotron Radiation in Materials Science Proceedings of the 4th Conference on Synchrotron Radiation in Materials Science -
Duration: 2004 Aug 232004 Aug 25


  • Impurity
  • Local structure
  • Silicon steel
  • X-ray holography


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