X-ray phase-imaging scanner with tiled bent gratings for large-field-of-view nondestructive testing

Masashi Kageyama, Kenichi Okajima, Minoru Maesawa, Masahiro Nonoguchi, Takafumi Koike, Manabu Noguchi, Ayuta Yamada, Enji Morita, Satomi Kawase, Masaru Kuribayashi, Yukihiro Hara, Shivaji Bachche, Atsushi Momose

Research output: Contribution to journalArticlepeer-review

17 Citations (Scopus)


X-ray phase imaging based on X-ray Talbot-Lau interferometry is an emerging nondestructive testing (NDT) method applicable to materials consisting of light elements such as organic and plastic materials. Aiming at future application to the examination of objects carried on conveyor systems, a scanner-type X-ray phase imaging apparatus is developed. Following the verification of the algorithm for phase-scanner image formation (S. Bachche et al., Sci. Rep., 2017), we report on a development with a desk-sized compact configuration and a 200-mm-wide field of view. Gratings used to construct an X-ray Talbot-Lau interferometer are bent and tiled. A scan speed of 9.2 mm/s with a spatial resolution of 0.29 mm is achieved in resultant images of absorption and scattering. Three scattering images are obtained for a carbon fiber reinforced plastic sample by changing its orientation against the gratings to visualize anisotropic fibrous structures.

Original languageEnglish
Pages (from-to)19-24
Number of pages6
JournalNDT and E International
Publication statusPublished - 2019 Jul


  • Anisotropy
  • CFRP
  • Grating
  • Scanner
  • Talbot-Lau interferometer
  • X-ray phase contrast


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