Abstract
X-ray phase imaging with a single phase grating based on the fractional Talbot effect is described. A phase grating with an 8 μm pitch was placed behind a weakly absorbing object and illuminated with partially coherent 17.7 keV X-rays. Intensity patterns downstream of the grating were recorded with a high-resolution image detector. By the fringe scanning method, an X-ray wavefront inclination by the object was obtained. Phase tomography was performed and Moosethe three-dimensional structure of a piece of a polymer blend was revealed with an 8 μm spatial resolution and a 9mg/cm3 detection limit of density deviation.
Original language | English |
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Pages (from-to) | L89-L91 |
Journal | Japanese Journal of Applied Physics, Part 2: Letters |
Volume | 46 |
Issue number | 1-3 |
DOIs | |
Publication status | Published - 2007 Jan 12 |
Externally published | Yes |
Keywords
- Phase measurement
- Talbot effect
- Tomography
- X-ray imaging
- X-ray interferometer
ASJC Scopus subject areas
- Engineering(all)
- Physics and Astronomy(all)