X-ray phase imaging with single phase grating

Yoshihiro Takeda, Wataru Yashiro, Yoshio Suzuki, Sadao Aoki, Tadashi Hattori, Atsushi Momose

Research output: Contribution to journalArticlepeer-review

50 Citations (Scopus)


X-ray phase imaging with a single phase grating based on the fractional Talbot effect is described. A phase grating with an 8 μm pitch was placed behind a weakly absorbing object and illuminated with partially coherent 17.7 keV X-rays. Intensity patterns downstream of the grating were recorded with a high-resolution image detector. By the fringe scanning method, an X-ray wavefront inclination by the object was obtained. Phase tomography was performed and Moosethe three-dimensional structure of a piece of a polymer blend was revealed with an 8 μm spatial resolution and a 9mg/cm3 detection limit of density deviation.

Original languageEnglish
Pages (from-to)L89-L91
JournalJapanese Journal of Applied Physics, Part 2: Letters
Issue number1-3
Publication statusPublished - 2007 Jan 12
Externally publishedYes


  • Phase measurement
  • Talbot effect
  • Tomography
  • X-ray imaging
  • X-ray interferometer

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)


Dive into the research topics of 'X-ray phase imaging with single phase grating'. Together they form a unique fingerprint.

Cite this