TY - JOUR
T1 - X-ray photoelectron diffraction and surface core-level shift study of clean InP (001)
AU - Shimomura, M.
AU - Sanada, N.
AU - Kaneda, G.
AU - Takeuchi, T.
AU - Suzuki, Y.
AU - Fukuda, Y.
AU - Huff, W. R.A.
AU - Abukawa, T.
AU - Kono, S.
AU - Yeom, H. W.
AU - Kakizaki, A.
PY - 1998/9/3
Y1 - 1998/9/3
N2 - A clean InP(001) surface treated by ion-bombardment and annealing (IBA) has been studied by X-ray photoelectron diffraction (XPD) and synchrotron radiation based photoemission spectroscopy (SRPES). The XPD pattern of In 3d5/2 (measured at 55° from the surface normal) is compared with a calculated XPD pattern obtained from a single-scattering cluster simulation. Our results indicate that IBA-treated InP(001) exhibits a (2 x 4) surface reconstruction. That is, the two-fold and four-fold directions correspond to the [110] and [110] axes, respectively. For the SRPES study, In 4d core-level spectra (hv = 70 eV) were collected at a variety of photoemission angles. Four spin-orbit doublets were necessary to obtain a high-quality fit to the photoemission spectra. As the detection angle was changed toward the surface parallel, a component having a lower binding energy by 0.70 eV than that of the bulk undergoes a dramatic intensity increase. On the basis of the energy shift and polar angle dependence of this component, we suggest that it arises from surface-layer indium atoms bonded to other indium atoms. The origins of other components are discussed.
AB - A clean InP(001) surface treated by ion-bombardment and annealing (IBA) has been studied by X-ray photoelectron diffraction (XPD) and synchrotron radiation based photoemission spectroscopy (SRPES). The XPD pattern of In 3d5/2 (measured at 55° from the surface normal) is compared with a calculated XPD pattern obtained from a single-scattering cluster simulation. Our results indicate that IBA-treated InP(001) exhibits a (2 x 4) surface reconstruction. That is, the two-fold and four-fold directions correspond to the [110] and [110] axes, respectively. For the SRPES study, In 4d core-level spectra (hv = 70 eV) were collected at a variety of photoemission angles. Four spin-orbit doublets were necessary to obtain a high-quality fit to the photoemission spectra. As the detection angle was changed toward the surface parallel, a component having a lower binding energy by 0.70 eV than that of the bulk undergoes a dramatic intensity increase. On the basis of the energy shift and polar angle dependence of this component, we suggest that it arises from surface-layer indium atoms bonded to other indium atoms. The origins of other components are discussed.
KW - Indium phosphide
KW - Low index single crystal surfaces
KW - Photoelectron diffraction
KW - Semiconductor surfaces
KW - Surface structure
KW - Synchrotron radiation photoelectron spectroscopy
UR - http://www.scopus.com/inward/record.url?scp=0032165312&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0032165312&partnerID=8YFLogxK
U2 - 10.1016/S0039-6028(98)00494-4
DO - 10.1016/S0039-6028(98)00494-4
M3 - Article
AN - SCOPUS:0032165312
SN - 0039-6028
VL - 412-413
SP - 625
EP - 630
JO - Surface Science
JF - Surface Science
ER -