XPS study on band alignment at Pt-O-terminated ZnO(000̄1) interface

Taeyoung Kim; Michiko Yoshitake; Shinjiro Yagyu; Slavomir Nemsak; Takahiro Nagata; Toyohiro Chikyow

doi:10.1002/sia.3601

XPS study on band alignment at Pt-O-terminated ZnO(000̄1) interface

Taeyoung Kim, Michiko Yoshitake, Shinjiro Yagyu, Slavomir Nemsak, Takahiro Nagata, Toyohiro Chikyow

Research output: Contribution to journal › Article › peer-review

22 Citations (Scopus)

Abstract

The band alignment at the interface between Pt and O-terminated ZnO(0001) was investigated by depositing Pt films on ZnO using X-ray photoelectron spectroscopy and ultra violet photoelectron spectroscopy in an ultrahigh vacuum system. Angle-resolved X-ray photoelectron spectroscopy measurement showed the band was bent down by 0.06 eV at the ZnO(0001) surface. The binding energy of Zn 2p doublet shifted toward higher values by 0.37 eV when Pt was deposited on ZnO(0001). The work function of ZnO(0001) was 4.08 eV and the valence band maximum measured by UPS on the clean ZnO(0001) surface was 2.82 eV. As a result, the Schottky barrier height of Pt/ZnO(0001) was 0.72 eV in this experiment.

Original language	English
Pages (from-to)	1528-1531
Number of pages	4
Journal	Surface and Interface Analysis
Volume	42
Issue number	10-11
DOIs	https://doi.org/10.1002/sia.3601
Publication status	Published - 2010 Oct 1
Externally published	Yes

Keywords

Band alignment
Pt
UPS
Work function
XPS
ZnO

ASJC Scopus subject areas

Chemistry(all)
Condensed Matter Physics
Surfaces and Interfaces
Surfaces, Coatings and Films
Materials Chemistry

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10.1002/sia.3601

Cite this

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abstract = "The band alignment at the interface between Pt and O-terminated ZnO(0001) was investigated by depositing Pt films on ZnO using X-ray photoelectron spectroscopy and ultra violet photoelectron spectroscopy in an ultrahigh vacuum system. Angle-resolved X-ray photoelectron spectroscopy measurement showed the band was bent down by 0.06 eV at the ZnO(0001) surface. The binding energy of Zn 2p doublet shifted toward higher values by 0.37 eV when Pt was deposited on ZnO(0001). The work function of ZnO(0001) was 4.08 eV and the valence band maximum measured by UPS on the clean ZnO(0001) surface was 2.82 eV. As a result, the Schottky barrier height of Pt/ZnO(0001) was 0.72 eV in this experiment.",

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AU - Kim, Taeyoung

AU - Yoshitake, Michiko

AU - Yagyu, Shinjiro

AU - Nemsak, Slavomir

AU - Nagata, Takahiro

AU - Chikyow, Toyohiro

PY - 2010/10/1

Y1 - 2010/10/1

N2 - The band alignment at the interface between Pt and O-terminated ZnO(0001) was investigated by depositing Pt films on ZnO using X-ray photoelectron spectroscopy and ultra violet photoelectron spectroscopy in an ultrahigh vacuum system. Angle-resolved X-ray photoelectron spectroscopy measurement showed the band was bent down by 0.06 eV at the ZnO(0001) surface. The binding energy of Zn 2p doublet shifted toward higher values by 0.37 eV when Pt was deposited on ZnO(0001). The work function of ZnO(0001) was 4.08 eV and the valence band maximum measured by UPS on the clean ZnO(0001) surface was 2.82 eV. As a result, the Schottky barrier height of Pt/ZnO(0001) was 0.72 eV in this experiment.

AB - The band alignment at the interface between Pt and O-terminated ZnO(0001) was investigated by depositing Pt films on ZnO using X-ray photoelectron spectroscopy and ultra violet photoelectron spectroscopy in an ultrahigh vacuum system. Angle-resolved X-ray photoelectron spectroscopy measurement showed the band was bent down by 0.06 eV at the ZnO(0001) surface. The binding energy of Zn 2p doublet shifted toward higher values by 0.37 eV when Pt was deposited on ZnO(0001). The work function of ZnO(0001) was 4.08 eV and the valence band maximum measured by UPS on the clean ZnO(0001) surface was 2.82 eV. As a result, the Schottky barrier height of Pt/ZnO(0001) was 0.72 eV in this experiment.

KW - Band alignment

KW - Pt

KW - UPS

KW - Work function

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KW - ZnO

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XPS study on band alignment at Pt-O-terminated ZnO(000̄1) interface

Abstract

Keywords

ASJC Scopus subject areas

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