Ybco artificial grain boundary junctions on si

J. Chen, T. Yamashita, H. Suzuki, H. Myoren, K. Nakajima, Y. Osaka

Research output: Contribution to journalLetterpeer-review

1 Citation (Scopus)


Si bicrystal substrates with different misorientation angles were fabricated using the hot-press method and their qualities were examined by SEM, TEM and XRD. YBa2Cu307-s(YBCO) epitaxial thin films were grown on such substrates by if magnetron sputtering, with yttria (Y2O3) and yttria-stabilized zirconia(YSZ) as the buffer layers. The properties of bridge type junctions patterned on the film by an excimer laser were studied from 4.2K to 77K. It was found that the critical current density of the artificial grain boundary(AGB) junction (JqA) was always less than that of the junction made on Si single-crystal grains (JcG)- The ratio JcA/JcG decreased exponentially as the misorientation angle(8) was increased. The effect of temperature and microwave irradiation showed that the properties of AGB junctions with θ<5° were limited by flux creep. In contrast, AGB junctions with θ≤10° showed the Josephson effect. Clear Shapiro steps and Josephson mixing were observed at 77K.

Original languageEnglish
Pages (from-to)2333-2336
Number of pages4
JournalIEEE Transactions on Applied Superconductivity
Issue number1
Publication statusPublished - 1993 Mar

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering


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