年別の研究成果
年別の研究成果
検索結果
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2020
Correction: Analytical Thermal Model for Self-Heating in Advanced FinFET Devices With Implications for Design and Reliability (IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (2013) 32:7 (1045-1058) DOI: 10.1109/TCAD.2013.2248194)
Xu, C., Kolluri, S. K., Endo, K. & Banerjee, K., 2020 1月, In: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 39, 1, p. 277 1 p., 8939318.研究成果: ジャーナルへの寄稿 › コメント/討論
Open Access