Honjo, H.,
Nishioka, K.,
Miura, S.,
Naganuma, H.,
Watanabe, T.,
Nasuno, T.,
Tanigawa, T.,
Noguchi, Y.,
Inoue, H.,
Yasuhira, M.,
Ikeda, S. &
Endoh, T.,
2022,
2022 International Electron Devices Meeting, IEDM 2022. Institute of Electrical and Electronics Engineers Inc.,
p. 1031-1034 4 p. (Technical Digest - International Electron Devices Meeting, IEDM; vol. 2022-December).
研究成果: Conference contribution