A micro optical probe for edge contour evaluation of diamond cutting tools

S. H. Jang, Yuki Shimizu, So Ito, W. Gao

研究成果: Article査読

8 被引用数 (Scopus)


This paper presents a micro optical probe, which is employed to evaluate edge contours of single point diamond tools with a size in a range of several millimetres. The micro optical probe consists of a laser source with a wavelength of 405 nm, an objective lens with a numerical aperture of 0.25, a photodiode for measurement, and a compensating optical system including another photodiode for compensation of laser intensity. A collimated laser beam, which is divided by a beam splitter in the compensating optical system, is focused by the objective lens so that the focused spot can be used as the micro optical probe. The micro optical probe traces over an edge contour of an objective tool while the signals of both the two photodiodes are monitored. The output of the photodiode for measurement is compensated by using that of the photodiode for laser intensity compensation to eliminate the influence of the laser instability. The signal of the photodiode for measurement is used to define the deviation of edge contour within the diameter of the micro optical probe. To verify the feasibility of the developed optical probe, the optical system was mounted on a diamond turning machine, and some experiments were carried out. Two types of edge contours of the diamond tools having a straight cutting edge and a round cutting edge were measured on the machine.

ジャーナルJournal of Sensors and Sensor Systems
出版ステータスPublished - 2014 3月 28

ASJC Scopus subject areas

  • 器械工学
  • 電子工学および電気工学


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