TY - JOUR
T1 - Crystal growth and piezoelectric properties of Ca3Ta(Ga0.9Sc0.1)3Si2O14 bulk single crystal
AU - Igarashi, Yu
AU - Yokota, Yuui
AU - Ohashi, Yuji
AU - Inoue, Kenji
AU - Yamaji, Akihiro
AU - Shoji, Yasuhiro
AU - Kamada, Kei
AU - Kurosawa, Shunsuke
AU - Yoshikawa, Akira
N1 - Funding Information:
This work was supported by Japan Science and Technology Agency (JST), Adaptable and Seamless Technology Transfer Program through Target-Driven R&D (A-STEP) Grant number AS272S003a , and New Energy and Industrial Technology Development Organization (NEDO).
Publisher Copyright:
© 2017
PY - 2018/3/1
Y1 - 2018/3/1
N2 - Ca3Ta(Ga0.9Sc0.1)3Si2O14 langasite-type single crystal with a diameter of 1 in. was grown by Czochralski (Cz) method. Obtained crystal had good crystallinity and its lattice constants exceeded those of Ca3TaGa3Si2O14 (CTGS) according to the X-ray analysis. A crack-free specimen cut from the grown crystal was used for the measurements of dielectric constant ε11T/ε0, electromechanical coupling factor k12, and piezoelectric constant d11. The accuracies of these measurements were better than those for the crystal grown by micro-pulling-down (μ-PD) method. Substitution of Ga with Sc resulted modification of these constants in the directions opposite to those observed after partial substitution of Ga (of CTGS) with Al. This suggests that increase of |d14| was most probably associated with enlargement of average size of the Ga sites. The crystal reported here had greater dimensions as compared to analogous crystals grown by the μ-PD method. As a result, accuracy of determination of acoustic constants of this material may be improved.
AB - Ca3Ta(Ga0.9Sc0.1)3Si2O14 langasite-type single crystal with a diameter of 1 in. was grown by Czochralski (Cz) method. Obtained crystal had good crystallinity and its lattice constants exceeded those of Ca3TaGa3Si2O14 (CTGS) according to the X-ray analysis. A crack-free specimen cut from the grown crystal was used for the measurements of dielectric constant ε11T/ε0, electromechanical coupling factor k12, and piezoelectric constant d11. The accuracies of these measurements were better than those for the crystal grown by micro-pulling-down (μ-PD) method. Substitution of Ga with Sc resulted modification of these constants in the directions opposite to those observed after partial substitution of Ga (of CTGS) with Al. This suggests that increase of |d14| was most probably associated with enlargement of average size of the Ga sites. The crystal reported here had greater dimensions as compared to analogous crystals grown by the μ-PD method. As a result, accuracy of determination of acoustic constants of this material may be improved.
KW - A1. Characterization
KW - A2. Czochralski method
KW - A2. Single crystal growth
KW - B1. Oxides
KW - B2. Piezoelectric materials
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U2 - 10.1016/j.jcrysgro.2017.12.041
DO - 10.1016/j.jcrysgro.2017.12.041
M3 - Article
AN - SCOPUS:85040221470
SN - 0022-0248
VL - 485
SP - 69
EP - 72
JO - Journal of Crystal Growth
JF - Journal of Crystal Growth
ER -