Epitaxial (001)-oriented (1 - x)BiFeO3-xBiCoO3 solid solution films with x = 0-0.33 were grown on (100)SrTiO3 substrates at 700°C by metalorganic chemical vapor deposition. The crystal structure of the films was characterized by high-resolution X-ray diffraction analysis and Raman spectroscopy. Unit cell volume and the lattice parameter were changed with increasing x. The BiFeO3 film with = 0 has rhombohedral symmetry and those with x = 0.16 and 0.21 have a mixture of rhombohedral and tetragonal symmetries. Finally, tetragonal symmetry was observed for the film with x = 0.33 together with a small amount of the contamination phase. This result suggests that the symmetry of (1 - x)BiFeO3-xBiCoO3 films changed from rhombohedral to tetragonal with increasing x similarly to Pb(Zr,Ti)O 3 having a large piezo response.
|ジャーナル||Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers|
|出版ステータス||Published - 2007 10月 22|
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