Development of fast scanning microscopic XAFS measurement system

T. Tsuji, T. Uruga, K. Nitta, N. Kawamura, M. Mizumaki, M. Suzuki, O. Sekizawa, N. Ishiguro, M. Tada, H. Ohashi, H. Yamazaki, H. Yumoto, T. Koyama, Y. Senba, T. Takeuchi, Y. Terada, N. Nariyama, K. Takeshita, A. Fujiwara, S. GotoM. Yamamoto, M. Takata, T. Ishikawa

研究成果: Conference article査読

5 被引用数 (Scopus)


We have developed a fast scanning microscopic X-ray absorption fine-structure (XAFS) measurement system using a 100-300 nm focused X-ray beam at the BL39XU nano-scale analysis station at SPring-8. This system provides two-dimensional XAFS images constructed from X-ray fluorescence (XRF) images measured by fast continuous 2-dimensional scanning at all XAFS measurement energies. High-quality XAFS spectra at each position were obtained by correcting shift in the XRF images. We applied our proposed method to measuring single catalyst particles, and succeeded in measuring the microscopic x-ray absorption near-edge structure (XANES) images that were 2-4 μm square with a spatial resolution of 300 nm.

ジャーナルJournal of Physics: Conference Series
出版ステータスPublished - 2013
イベント15th International Conference on X-Ray Absorption Fine Structure, XAFS 2012 - Beijing, China
継続期間: 2012 7月 222012 7月 28

ASJC Scopus subject areas

  • 物理学および天文学(全般)


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