TY - JOUR
T1 - Development of fast scanning microscopic XAFS measurement system
AU - Tsuji, T.
AU - Uruga, T.
AU - Nitta, K.
AU - Kawamura, N.
AU - Mizumaki, M.
AU - Suzuki, M.
AU - Sekizawa, O.
AU - Ishiguro, N.
AU - Tada, M.
AU - Ohashi, H.
AU - Yamazaki, H.
AU - Yumoto, H.
AU - Koyama, T.
AU - Senba, Y.
AU - Takeuchi, T.
AU - Terada, Y.
AU - Nariyama, N.
AU - Takeshita, K.
AU - Fujiwara, A.
AU - Goto, S.
AU - Yamamoto, M.
AU - Takata, M.
AU - Ishikawa, T.
PY - 2013
Y1 - 2013
N2 - We have developed a fast scanning microscopic X-ray absorption fine-structure (XAFS) measurement system using a 100-300 nm focused X-ray beam at the BL39XU nano-scale analysis station at SPring-8. This system provides two-dimensional XAFS images constructed from X-ray fluorescence (XRF) images measured by fast continuous 2-dimensional scanning at all XAFS measurement energies. High-quality XAFS spectra at each position were obtained by correcting shift in the XRF images. We applied our proposed method to measuring single catalyst particles, and succeeded in measuring the microscopic x-ray absorption near-edge structure (XANES) images that were 2-4 μm square with a spatial resolution of 300 nm.
AB - We have developed a fast scanning microscopic X-ray absorption fine-structure (XAFS) measurement system using a 100-300 nm focused X-ray beam at the BL39XU nano-scale analysis station at SPring-8. This system provides two-dimensional XAFS images constructed from X-ray fluorescence (XRF) images measured by fast continuous 2-dimensional scanning at all XAFS measurement energies. High-quality XAFS spectra at each position were obtained by correcting shift in the XRF images. We applied our proposed method to measuring single catalyst particles, and succeeded in measuring the microscopic x-ray absorption near-edge structure (XANES) images that were 2-4 μm square with a spatial resolution of 300 nm.
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U2 - 10.1088/1742-6596/430/1/012019
DO - 10.1088/1742-6596/430/1/012019
M3 - Conference article
AN - SCOPUS:84877360003
SN - 1742-6588
VL - 430
JO - Journal of Physics: Conference Series
JF - Journal of Physics: Conference Series
IS - 1
M1 - 012019
T2 - 15th International Conference on X-Ray Absorption Fine Structure, XAFS 2012
Y2 - 22 July 2012 through 28 July 2012
ER -