Development of grating interferometer-based stroboscopic X-ray tomography

Yanlin Wu, Hidekazu Takano, Atsushi Momose

研究成果: 書籍の章/レポート/Proceedings会議への寄与査読

2 被引用数 (Scopus)

抄録

X-ray phase/dark-field tomography by using an X-ray grating interferometer and white synchrotron radiation has been demonstrated to observe dynamics in materials consisting of light elements, because it is available with X-rays of a broad energy bandwidth. In this work, we combined X-ray phase/dark-field tomography with a stroboscopic technique, which synchronizes image acquisitions with repetitive tension applied to a sample. Snapshot images with a 200 μs temporal resolution are measured to reconstruct phase/dark-field tomograms. A result of stroboscopic X-ray dark-field tomography is described, which was obtained for a rubber sample under a 24 Hz repetitive compression-stretch motion of a 10 mm amplitude.

本文言語英語
ホスト出版物のタイトルDevelopments in X-Ray Tomography XII
編集者Bert Muller, Ge Wang
出版社SPIE
ISBN(電子版)9781510629196
DOI
出版ステータス出版済み - 2019
イベント12th SPIE Conference on Developments in X-Ray Tomography 2019 - San Diego, 米国
継続期間: 2019 8月 132019 8月 15

出版物シリーズ

名前Proceedings of SPIE - The International Society for Optical Engineering
11113
ISSN(印刷版)0277-786X
ISSN(電子版)1996-756X

会議

会議12th SPIE Conference on Developments in X-Ray Tomography 2019
国/地域米国
CitySan Diego
Period19/8/1319/8/15

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