Development of massive parallel electron beam write system

Masayoshi Esashi, Hiroshi Miyaguchi, Akira Kojima, Naokatsu Ikegami, Nobuyoshi Koshida, Masanori Sugata, Hideyuki Ohyi

研究成果: Conference contribution

抄録

Prototype of Massively Parallel Electron Beam Write (MPEBW) system was developed for mask less lithography. A 100×100 array of nanocrystalline-silicon (nc-Si) electron emitter is controlled by an active matrix driving LSI. The LSI receives external writing bitmap data, and switches 100×100 electron beamlets on/off. The operation of the LSI was confirmed and 1/100 reduction electron optic system using the active matrix emitter array was fabricated. A 17×17 nc-Si emitter array was assembled with a 1:1 exposure test system and driven by commercially available display driver LSIs. The active matrix electron beam (EB) exposure was confirmed.

本文言語English
ホスト出版物のタイトルPhotomask Japan 2019
ホスト出版物のサブタイトルXXVI Symposium on Photomask and Next-Generation Lithography Mask Technology
編集者Akihiko Ando
出版社SPIE
ISBN(電子版)9781510630734
DOI
出版ステータスPublished - 2019
イベント26th Symposium on Photomask and Next-Generation Lithography Mask Technology, Photomask Japan 2019 - Yokohama, Japan
継続期間: 2019 4月 162019 4月 18

出版物シリーズ

名前Proceedings of SPIE - The International Society for Optical Engineering
11178
ISSN(印刷版)0277-786X
ISSN(電子版)1996-756X

Conference

Conference26th Symposium on Photomask and Next-Generation Lithography Mask Technology, Photomask Japan 2019
国/地域Japan
CityYokohama
Period19/4/1619/4/18

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 凝縮系物理学
  • コンピュータ サイエンスの応用
  • 応用数学
  • 電子工学および電気工学

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