Development of tensile testing machine for x-ray microtomography

Masahiro Yoshinaga, Yukihiro Nishikawa, Hiroyuki Komori, Ichiro Koga, Masashi Inoue, Toshio Nishi, Hiroshi Jinnai

研究成果: 会議への寄与学会論文査読

抄録

X-ray microtomography (XμCT) is a powerful tool to observe the interior three-dimensional (3D) structures of the sample without destruction. By using the nano-focus X-ray source and high-resolution X-ray detectors, the spatial resolution of XμCT is approaching 1 μm. XμCT is applicable to the opaque samples, which is one of the advantages to the laser-scanning confocal microscopy. In the present study, a tensile testing machine was developed as an attachment to XμCT. The components of the tensile testing machine are enclosed in a monolithic beryllium tube, the diameter is 17 mm and the thickness is 1 mm. The maximum load is 100 N, and the range of the cross-head speed is 0.1 - 10 mm/min. The maximum stroke is 20 mm. The maximum thickness and width of the specimen are, respectively, 0.5 mm and 5.0 mm. The length of the sample is 15 mm to 25 mm.

本文言語英語
ページ1192
ページ数1
出版ステータス出版済み - 2006
イベント55th SPSJ Annual Meeting - Nagoya, 日本
継続期間: 2006 5月 242006 5月 26

会議

会議55th SPSJ Annual Meeting
国/地域日本
CityNagoya
Period06/5/2406/5/26

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