TY - JOUR
T1 - Direct domain wall thickness measurement using scanning nonlinear dielectric microscopy
AU - Cho, Y.
AU - Matsuura, K.
AU - Valanoor, N.
AU - Ramesh, R.
PY - 2003/6/1
Y1 - 2003/6/1
N2 - Using Scanning Nonlinear Dielectric Microscopy (SNDM) which has attained sub-nanometer resolution, we measured the linear dielectric constant of a-domains and c-domains in the (1,0,0) and (0,0,1) oriented PbZr 0.2 Ti 0.8 O 3 thin film and confirmed that the dielectric constant of a-domain is higher than that of c-domain. Next, we observed 90 domain walls (a-c domain walls) and 180 domain walls (c-c domain walls) and we obtained the minimum value of 180 c-c domain wall thickness was 1.87 nm and 90 a-c domain wall was 2.52 nm.
AB - Using Scanning Nonlinear Dielectric Microscopy (SNDM) which has attained sub-nanometer resolution, we measured the linear dielectric constant of a-domains and c-domains in the (1,0,0) and (0,0,1) oriented PbZr 0.2 Ti 0.8 O 3 thin film and confirmed that the dielectric constant of a-domain is higher than that of c-domain. Next, we observed 90 domain walls (a-c domain walls) and 180 domain walls (c-c domain walls) and we obtained the minimum value of 180 c-c domain wall thickness was 1.87 nm and 90 a-c domain wall was 2.52 nm.
KW - 180° c-c domain wall
KW - 90° a-c domain wall
KW - Linear dielectric constant
KW - Nonlinear dielectric constant
KW - PZT thin film
KW - Scanning nonlinear dielectric microscopy
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U2 - 10.1080/00150190390222961
DO - 10.1080/00150190390222961
M3 - Article
AN - SCOPUS:33746279412
SN - 0015-0193
VL - 292
SP - 171
EP - 180
JO - Ferroelectrics
JF - Ferroelectrics
ER -