TY - JOUR
T1 - Displacement measurement using grating images detected by CCD image sensor
AU - Hane, K.
AU - Grover, C. P.
PY - 1990
Y1 - 1990
N2 - Recently, the interference phenomenon known as grating imaging has been studied for some practical applications as well as for the theoretical interest. When the object grating, which is illuminated incoherently, is located in the vicinity of the transmission grating, the magnified image of the object grating is obtained at the image distances far from the gratings. Since the high magnification (approximately 102 to 103) can be obtained, the image displacement is very sensitive to that of the object. We propose here a displacement sensing technique using the grating images detected by CCD image sensor. The images are processed with a computer by using a spatial phase detection method. The lateral displacement and the distance separating the two gratings can be obtained simultaneously and separately. The proposed technique will be useful as a compact two dimentional displacement sensing method in opto-mechanical systems.
AB - Recently, the interference phenomenon known as grating imaging has been studied for some practical applications as well as for the theoretical interest. When the object grating, which is illuminated incoherently, is located in the vicinity of the transmission grating, the magnified image of the object grating is obtained at the image distances far from the gratings. Since the high magnification (approximately 102 to 103) can be obtained, the image displacement is very sensitive to that of the object. We propose here a displacement sensing technique using the grating images detected by CCD image sensor. The images are processed with a computer by using a spatial phase detection method. The lateral displacement and the distance separating the two gratings can be obtained simultaneously and separately. The proposed technique will be useful as a compact two dimentional displacement sensing method in opto-mechanical systems.
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M3 - Conference article
AN - SCOPUS:0025535094
SN - 0277-786X
VL - 1332
SP - 584
EP - 590
JO - Proceedings of SPIE - The International Society for Optical Engineering
JF - Proceedings of SPIE - The International Society for Optical Engineering
IS - pt 2
T2 - Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection
Y2 - 8 July 1990 through 13 July 1990
ER -