Electron microscopy analysis of dislocation behavior in HVPE-AlGaN layer grown on a stripe-patterned (0 0 0 1) sapphire substrate
Noriyuki Kuwano, Yuta Kugiyama, Yutaka Nishikouri, Tadashige Sato, Akira Usui
研究成果: ジャーナルへの寄稿 › 学術論文 › 査読
10
被引用数
(Scopus)