@inproceedings{1c93c8ba534c441c9b3ff91e2d62dbf3,
title = "Fully integrated active magnetic probe for high-definition near-field measurement",
abstract = "In order to diagnose the topical EMI problem in ICs, a fully integrated active magnetic probe has been developed in SOI-CMOS technology. A 2-turn differential coil, differential amplifiers, a differential to single-ended converter, a output buffer and bias circuits are all integrated in a single-chip. Measurement result shows that it gains the high e-field suppression ratio of 38.0dB at 50MHz. Furthermore, the first 2D magnetic distribution map has been drawn by the active probe. The obtained image is finer than that of a shielded loop coil and it can prove an active probe to be a pragmatic diagnosis tool.",
keywords = "Active probe, EMC, EMI, Magnetic probe, Near-field measurement, Noise mapping, SOI-CMOS",
author = "Satoshi Aoyama and Masahiro Yamaguchi and Shoji Kawahito",
year = "2006",
month = dec,
day = "1",
language = "English",
isbn = "142440293X",
series = "IEEE International Symposium on Electromagnetic Compatibility",
pages = "426--429",
booktitle = "2006 IEEE International Symposium on Electromagnetic Compatibility, EMC 2006",
note = "2006 IEEE International Symposium on Electromagnetic Compatibility, EMC 2006 ; Conference date: 14-08-2006 Through 18-08-2006",
}