Fundamental Study on a Mechanism of Faulty Outputs from Cryptographic Modules Due to IEMI

研究成果: ジャーナルへの寄稿学術論文査読

抄録

This paper investigates the mechanism underlying faulty outputs from cryptographic modules due to intentional electromagnetic interference (IEMI), which causes information leakage in electronic devices without disrupting their functions or damaging their components. We show this fault mechanism through experiments using the faulty ciphertexts and pulse injection to a specific round in the encryption process. The experimental results indicate that faulty outputs from cryptographic modules are caused by setup time violation in the cryptographic module.

本文言語英語
ページ(範囲)72-78
ページ数7
ジャーナルElectronics and Communications in Japan
99
9
DOI
出版ステータス出版済み - 2016 9月 1

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