Group delay ripple reduction and reflectivity increase in a chirped fiber Bragg grating by multiple-overwriting of a phase mask with an electron-beam

Tetsuro Komukai, Tetsuro Inui, Masataka Nakazawa

研究成果: ジャーナルへの寄稿学術論文査読

20 被引用数 (Scopus)

抄録

The phase errors in electron-beam-written step-chirped masks can be reduced by using a method based on the continuous movement approach and overwriting a pattern at the same place on the substrate several times. The group delay ripple of chirped fiber Bragg gratings fabricated by a four-times-overwritten phase mask is comparable with that of gratings obtained using a holographically written chirped phase mask.

本文言語英語
ページ(範囲)816-818
ページ数3
ジャーナルIEEE Photonics Technology Letters
12
7
DOI
出版ステータス出版済み - 2000 7月

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