Heterogeneous integration based on low-temperature bonding for advanced optoelectronic devices

研究成果: ジャーナルへの寄稿学術論文査読

18 被引用数 (Scopus)

抄録

Heterogeneous integration is an attractive approach to manufacturing future optoelectronic devices. Recent progress in low-temperature bonding techniques such as plasma activation bonding (PAB) and surface-activated bonding (SAB) enables a new approach to integrating dissimilar materials for a wide range of photonics applications. In this paper, low-temperature direct bonding and intermediate layer bonding techniques are focused, and their state-of-the-art applications in optoelectronic devices are reviewed. First, we describe the room-temperature direct bonding of Ge/Ge and Ge/Si wafers for photodetectors and of GaAs/SiC wafers for high-power semiconductor lasers. Then, we describe low-temperature intermediate layer bonding using Au and lead-free Sn-3.0Ag-0.5Cu solders for optical sensors and MEMS packaging.

本文言語英語
論文番号04FA02
ジャーナルJapanese Journal of Applied Physics
57
4
DOI
出版ステータス出版済み - 2018 4月

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