High-reflection multilayer for wavelength range of 200-30 nm

Y. Kondo, T. Ejima, K. Saito, T. Hatano, M. Watanabe

    研究成果: Article査読

    16 被引用数 (Scopus)

    抄録

    Composite multilayers consisting of a top single layer and piled double layers with high reflectance through a 200-30 nm wavelength range have been designed and fabricated for normal incidence optical systems and the performance was checked in a 140-30 nm range. The normal incidence reflectance of SiC (top layer)-Y2O3/Mg (double layers) multilayer was more than 14% in a range of 40-30 nm which is much higher than those of W, and 20-40% above 50 nm which is comparable with that of W. The reflectance of SiC (top layer)-Mg/SiC (double layers) multilayer was a little lower than those values.

    本文言語English
    ページ(範囲)333-336
    ページ数4
    ジャーナルNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
    467-468
    DOI
    出版ステータスPublished - 2001 7月 21

    ASJC Scopus subject areas

    • 核物理学および高エネルギー物理学
    • 器械工学

    フィンガープリント

    「High-reflection multilayer for wavelength range of 200-30 nm」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

    引用スタイル