抄録
Composite multilayers consisting of a top single layer and piled double layers with high reflectance through a 200-30 nm wavelength range have been designed and fabricated for normal incidence optical systems and the performance was checked in a 140-30 nm range. The normal incidence reflectance of SiC (top layer)-Y2O3/Mg (double layers) multilayer was more than 14% in a range of 40-30 nm which is much higher than those of W, and 20-40% above 50 nm which is comparable with that of W. The reflectance of SiC (top layer)-Mg/SiC (double layers) multilayer was a little lower than those values.
本文言語 | English |
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ページ(範囲) | 333-336 |
ページ数 | 4 |
ジャーナル | Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment |
巻 | 467-468 |
DOI | |
出版ステータス | Published - 2001 7月 21 |
ASJC Scopus subject areas
- 核物理学および高エネルギー物理学
- 器械工学