High-resolution angle-resolved photoemission study of layered transition-metal dichalcogenides Nb_1-xTi_xXc₂ (Xc = S, Se, Te)

Chemistry

• Chalcogen 50%
• Electron Particle 50%
• Electronic Band Structure 50%
• Metal-Semiconductor Transition 50%
• Photoemission 50%
• Scattering 50%
• Strength 50%
• Substitution Reaction 50%
• Transition Element 100%

Material Science

• Angle-Resolved Photoemission Spectroscopy 100%
• Transition Metal Dichalcogenides 50%