IEMI Fault Injection Method Using Continuous Sinusoidal Wave with Controlled Frequency, Amplitude, and Phase

Hikaru Nishiyama, Daisuke Fujimoto, Youngwoo Kim, Hideaki Sone, Yu-Ichi Hayashi

研究成果: Conference contribution

1 被引用数 (Scopus)

抄録

A fault injection attack based on an intentional electromagnetic interference (IEMI) using a continuous sinusoidal wave can generate a fault that is applicable for the differential fault analysis (DFA) against cryptographic module non-invasively. However, previous studies often generate multi-byte faults in the output ciphertext which are not applicable for the DFA, and they increase the analysis time dramatically. In this paper, we propose an IEMI-based fault injection method that increases the occurrence of a one-byte fault in the output ciphertext by controlling the frequency, phase, and amplitude of the injected sinusoidal wave. Specifically, we control the frequency and phase of the sinusoidal wave injected into the cryptographic module implemented with the advanced encryption standard (AES). At the same time, the number of faults of the output ciphertext is monitored so that a glitch is generated in-phase at each rising edge of the clock. At this condition, the amplitude is controlled to further increase the timing difference between the rising timing of the original clock and the overclocking occurrence timing associated with the glitch. Experimental results validated that the proposed method can increase the ratio of the number of one-byte faults to the number of faults. From the experimental results, we discuss a direction to further improve the method to maximize one-byte faults for the future study.

本文言語English
ホスト出版物のタイトル2021 13th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, EMC Compo 2021
出版社Institute of Electrical and Electronics Engineers Inc.
ページ97-101
ページ数5
ISBN(電子版)9781665423809
DOI
出版ステータスPublished - 2021
イベント13th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, EMC Compo 2021 - Virtual, Bruges, Belgium
継続期間: 2022 3月 92022 3月 11

出版物シリーズ

名前2021 13th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, EMC Compo 2021

Conference

Conference13th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, EMC Compo 2021
国/地域Belgium
CityVirtual, Bruges
Period22/3/922/3/11

ASJC Scopus subject areas

  • 安全性、リスク、信頼性、品質管理
  • 電子工学および電気工学
  • 放射線

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