TY - GEN
T1 - IEMI Fault Injection Method Using Continuous Sinusoidal Wave with Controlled Frequency, Amplitude, and Phase
AU - Nishiyama, Hikaru
AU - Fujimoto, Daisuke
AU - Kim, Youngwoo
AU - Sone, Hideaki
AU - Hayashi, Yu-Ichi
N1 - Funding Information:
ACKNOWLEDGMENT This work was supported by JSPS KAKENHI Grant Numbers JP 20K19800, JP 20K14719, JP 17H01751 and JST FOREST Program, Grant Number JPMJFR206L.
Publisher Copyright:
© 2022 IEEE.
PY - 2021
Y1 - 2021
N2 - A fault injection attack based on an intentional electromagnetic interference (IEMI) using a continuous sinusoidal wave can generate a fault that is applicable for the differential fault analysis (DFA) against cryptographic module non-invasively. However, previous studies often generate multi-byte faults in the output ciphertext which are not applicable for the DFA, and they increase the analysis time dramatically. In this paper, we propose an IEMI-based fault injection method that increases the occurrence of a one-byte fault in the output ciphertext by controlling the frequency, phase, and amplitude of the injected sinusoidal wave. Specifically, we control the frequency and phase of the sinusoidal wave injected into the cryptographic module implemented with the advanced encryption standard (AES). At the same time, the number of faults of the output ciphertext is monitored so that a glitch is generated in-phase at each rising edge of the clock. At this condition, the amplitude is controlled to further increase the timing difference between the rising timing of the original clock and the overclocking occurrence timing associated with the glitch. Experimental results validated that the proposed method can increase the ratio of the number of one-byte faults to the number of faults. From the experimental results, we discuss a direction to further improve the method to maximize one-byte faults for the future study.
AB - A fault injection attack based on an intentional electromagnetic interference (IEMI) using a continuous sinusoidal wave can generate a fault that is applicable for the differential fault analysis (DFA) against cryptographic module non-invasively. However, previous studies often generate multi-byte faults in the output ciphertext which are not applicable for the DFA, and they increase the analysis time dramatically. In this paper, we propose an IEMI-based fault injection method that increases the occurrence of a one-byte fault in the output ciphertext by controlling the frequency, phase, and amplitude of the injected sinusoidal wave. Specifically, we control the frequency and phase of the sinusoidal wave injected into the cryptographic module implemented with the advanced encryption standard (AES). At the same time, the number of faults of the output ciphertext is monitored so that a glitch is generated in-phase at each rising edge of the clock. At this condition, the amplitude is controlled to further increase the timing difference between the rising timing of the original clock and the overclocking occurrence timing associated with the glitch. Experimental results validated that the proposed method can increase the ratio of the number of one-byte faults to the number of faults. From the experimental results, we discuss a direction to further improve the method to maximize one-byte faults for the future study.
KW - advanced encryption standard
KW - differential fault analysis
KW - fault injection
KW - intentional electromagnetic interference
UR - http://www.scopus.com/inward/record.url?scp=85129668801&partnerID=8YFLogxK
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U2 - 10.1109/EMCCompo52133.2022.9758626
DO - 10.1109/EMCCompo52133.2022.9758626
M3 - Conference contribution
AN - SCOPUS:85129668801
T3 - 2021 13th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, EMC Compo 2021
SP - 97
EP - 101
BT - 2021 13th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, EMC Compo 2021
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 13th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, EMC Compo 2021
Y2 - 9 March 2022 through 11 March 2022
ER -