抄録
A single-heterostructure of CuGaSe2/CuAlSe2 chalcopyrite semiconductors was successfully grown epitaxially on a GaAs(001) substrate using a low-pressure metal organic chemical vapor deposition technique. The valence-band discontinuity for the CuGaSe2/CuAlSe2 heterointerface was estimated to be 0.8±0.1 eV by means of X-ray photoelectron spectroscopy. The CuGaSe2/CuAlSe2 structure was found to have the straddling-type heterointerface, and the band discontinuity was found to be distributed mainly in the valence band.
本文言語 | 英語 |
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ページ(範囲) | L286-L289 |
ジャーナル | Japanese Journal of Applied Physics |
巻 | 33 |
号 | 3 |
DOI | |
出版ステータス | 出版済み - 1994 3月 |