抄録
Low-field mobility of two-dimensional electron gas (2DEG) in selectively doped pseudomorphic N-Al0.3Ga0.7As/ Ga 0.8In0.13As/GaAs structures was measured as a function of carrier concentration as well as a function of temperature. In order to explain the observed mobility characteristics, scattering due to clustering has been considered. It is shown that the low-field mobility of 2DEG at low temperature (<40 K) can be explained by the scattering due to clustering together with the remote ionized impurity scattering.
本文言語 | English |
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ページ(範囲) | 36-38 |
ページ数 | 3 |
ジャーナル | Applied Physics Letters |
巻 | 54 |
号 | 1 |
DOI | |
出版ステータス | Published - 1989 |
外部発表 | はい |
ASJC Scopus subject areas
- 物理学および天文学(その他)