TY - JOUR
T1 - Luminescence properties of scintillators in soft X-ray region
AU - Ejima, Takeo
AU - Kurosawa, Shunsuke
AU - Yamaji, Akihiro
AU - Hatano, Tadashi
AU - Wakayama, Toshitaka
AU - Higashiguchi, Takeshi
AU - Kitaura, Mamoru
N1 - Funding Information:
The measurements were performed under the approval of the Photon Factory Program Advisory Committee (Proposal No. 2018G072 ). We are particularly grateful to Prof. K. Mase and staff at the Photon Factory for their assistance in the measurements. Funding: This work was supported by JSPS, Japan KAKENHI (grant numbers 16H03902 and 17H190210 ). Appendix A
Publisher Copyright:
© 2019 The Authors
PY - 2020/3
Y1 - 2020/3
N2 - Both the total luminescence yield (TLY) and the luminescence spectra of scintillators were measured to identify which scintillator exhibited high luminosity in the soft X-ray (SX) region from 300 eV to 1.3 keV. The TLY intensities and the peak intensities of the luminescence spectra were compared to identify the scintillators that have high luminosity for reducing the pixel size of a two-dimensional detector by applying the stimulated emission depletion phenomenon. The obtained TLY intensities were Tl:CsI, Eu:GGG, Ce:LYSO, Tb:LSO, Eu:YAP and Ce:YAP (in descending order of strength), which differs from the known luminosities in the hard X-ray region. The order of the measured TLY intensity and the change of order between the present and the previous values of luminosities can be explained by the number of secondary electrons generated in the base material of the scintillator in the SX region.
AB - Both the total luminescence yield (TLY) and the luminescence spectra of scintillators were measured to identify which scintillator exhibited high luminosity in the soft X-ray (SX) region from 300 eV to 1.3 keV. The TLY intensities and the peak intensities of the luminescence spectra were compared to identify the scintillators that have high luminosity for reducing the pixel size of a two-dimensional detector by applying the stimulated emission depletion phenomenon. The obtained TLY intensities were Tl:CsI, Eu:GGG, Ce:LYSO, Tb:LSO, Eu:YAP and Ce:YAP (in descending order of strength), which differs from the known luminosities in the hard X-ray region. The order of the measured TLY intensity and the change of order between the present and the previous values of luminosities can be explained by the number of secondary electrons generated in the base material of the scintillator in the SX region.
KW - Extreme ultraviolet
KW - Luminescence
KW - Scintillator
KW - Soft X-ray
KW - Stimulated emission suppression
KW - Total luminescence yield
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U2 - 10.1016/j.jlumin.2019.116850
DO - 10.1016/j.jlumin.2019.116850
M3 - Article
AN - SCOPUS:85075352992
SN - 0022-2313
VL - 219
JO - Journal of Luminescence
JF - Journal of Luminescence
M1 - 116850
ER -