Micro-encoder based on higher-order diffracted light interference

Eiji Higurashi, Renshi Sawada

研究成果: Article査読

12 被引用数 (Scopus)

抄録

A micro-encoder based on higher-order diffracted light interference has been developed for use in high-precision positioning. It uses ±3-order diffracted beams to obtain interference fringes for displacement detection and provides six signal periods for moving the scale grating by one grating period (3.2 νm) without an interpolation electric circuit. This micro-encoder head includes a distributed feedback laser diode, edge-illuminated refracting-facet photodiodes, a pair of polyimide waveguides, each with a total internal reflection mirror, and a micro-grating that causes ±3-order beams, diffracted by the scale grating, to interfere coaxially. All of these components are on a micromachined Si optical bench (3 × 2 mm2).

本文言語English
ページ(範囲)1459-1465
ページ数7
ジャーナルJournal of Micromechanics and Microengineering
15
8
DOI
出版ステータスPublished - 2005 8月 1
外部発表はい

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 材料力学
  • 機械工学
  • 電子工学および電気工学

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