抄録
This paper describes the performance of a scanning nonlinear dielectric microscope when a gap exists between the specimen and the probe of the microscope. First, a theory for the sensitivity of the scanning nonlinear dielectric microscope as a function of the gap height is described. Second, using the microscope in a noncontact mode, an area scan of the polarization of an alternately poled ferroelectric thin film of a copolymer consisting of vinylidene fluoride and trifluoroethylene is carried out.
| 本文言語 | English |
|---|---|
| ページ（範囲） | 360-363 |
| ページ数 | 4 |
| ジャーナル | Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers |
| 巻 | 36 |
| 号 | 1 A |
| DOI | |
| 出版ステータス | Published - 1997 1月 |
| 外部発表 | はい |
ASJC Scopus subject areas
- 工学（全般）
- 物理学および天文学（全般）