This paper describes the performance of a scanning nonlinear dielectric microscope when a gap exists between the specimen and the probe of the microscope. First, a theory for the sensitivity of the scanning nonlinear dielectric microscope as a function of the gap height is described. Second, using the microscope in a noncontact mode, an area scan of the polarization of an alternately poled ferroelectric thin film of a copolymer consisting of vinylidene fluoride and trifluoroethylene is carried out.
|ジャーナル||Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers|
|出版ステータス||Published - 1997 1月|
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