Observation of interference fringes with a lattice spacing of 1.92 å in convergent-beam electron diffraction

Kenji Tsuda, Masami Terauchi, Michiyoshi Tanaka, Toshikatsu Kaneyama, Toshikazu Honda

研究成果: Article査読

5 被引用数 (Scopus)

抄録

The interference fringes with a lattice spacing of 1.92 Å for the 220 reflection of Si have been observed in convergent-beam electron diffraction patterns using a JEM 2010F electron microscope equipped with a field-emission gun. The fringes observed in the present study have the smallest lattice spacing among the fringes reported to date.

本文言語English
ページ(範囲)173-175
ページ数3
ジャーナルJournal of Electron Microscopy
43
3
出版ステータスPublished - 1994 6月

ASJC Scopus subject areas

  • 器械工学

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