Optimization of Ag Thin Film Thickness with a Capping Layer for Ag-Ag Surface Activated Bonding

Yuanhao Cai, Kai Takeuchi, Miyuki Uomoto, Takehito Shimatsu, Eiji Higurashi

研究成果: 書籍の章/レポート/Proceedings会議への寄与査読

抄録

In this work, we tried to fabricate a smooth Ag surface by reducing the thickness of Ag layer from 30 nm to 10 nm. The thickness of Ti capping layer was 2 nm and Ti adhesion layer has thickness with 5 nm. The results shows that the surface roughness of Ag thin film with Ti capping layer is smaller than Ag thin film without Ti capping layer for both thickness of Ag thin film. Furthermore, surface roughness (Sa)was reduced from about 0.7 nm to 0.35 nm by reducing the thickness of the Ag thin films from 30 nm to 10 nm, when the Ti capping layer was used.

本文言語英語
ホスト出版物のタイトル2024 International Conference on Electronics Packaging, ICEP 2024
出版社Institute of Electrical and Electronics Engineers Inc.
ページ117-118
ページ数2
ISBN(電子版)9784991191176
DOI
出版ステータス出版済み - 2024
イベント23rd International Conference on Electronics Packaging, ICEP 2024 - Toyama, 日本
継続期間: 2024 4月 172024 4月 20

出版物シリーズ

名前2024 International Conference on Electronics Packaging, ICEP 2024

会議

会議23rd International Conference on Electronics Packaging, ICEP 2024
国/地域日本
CityToyama
Period24/4/1724/4/20

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