Oxygen vacancies in amorphous HfO2 and SiO2

Chioko Kaneta, Takahiro Yamasaki

研究成果: 書籍の章/レポート/Proceedings会議への寄与査読

1 被引用数 (Scopus)

抄録

Formation energies and electronic properties of oxygen vacancies (Vo's) in amorphous HfO2 gate dielectrics are investigated by employing the first-principles method based on the density functional theory. We have found that the formation energy of neutral oxygen vacancy in amorphous HfO2 distributes from 4.7 to 6.1 eV, most of which is lower than the value for cubic HfO2, 6.0 eV. We also investigated the stabilities of the Vo pairs in various charged state and compared with those in amorphous SiO2. We found that the Vo++ is stabilized in the vicinity of the Vo in SiO2. In HfO2, however, this does not happen. This suggests the difference of defect propagation mechanism in HfO2 and SiO2.

本文言語英語
ホスト出版物のタイトルMaterials Science of High-K Dielectric Stacks - From Fundamentals to Technology
出版社Materials Research Society
ページ1-7
ページ数7
ISBN(印刷版)9781605608532
DOI
出版ステータス出版済み - 2008
イベント2008 MRS Spring Meeting - San Francisco, CA, 米国
継続期間: 2008 3月 242008 3月 28

出版物シリーズ

名前Materials Research Society Symposium Proceedings
1073
ISSN(印刷版)0272-9172

会議

会議2008 MRS Spring Meeting
国/地域米国
CitySan Francisco, CA
Period08/3/2408/3/28

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