TY - CHAP
T1 - Random imperfection (I)
AU - Ikeda, Kiyohiro
AU - Murota, Kazuo
PY - 2019/1/1
Y1 - 2019/1/1
N2 - The critical load of a structure is subject to a probabilistic scatter when it is modeled as a function of several random imperfections. This chapter offers a procedure to obtain the probability density function of the critical load for structures with a number of imperfections with known probabilistic characteristics. Chapter 3, “Imperfection Sensitivity Laws,” is a foundation of this chapter, and this chapter is extended to a system with group symmetry in Chap. 11.
AB - The critical load of a structure is subject to a probabilistic scatter when it is modeled as a function of several random imperfections. This chapter offers a procedure to obtain the probability density function of the critical load for structures with a number of imperfections with known probabilistic characteristics. Chapter 3, “Imperfection Sensitivity Laws,” is a foundation of this chapter, and this chapter is extended to a system with group symmetry in Chap. 11.
KW - Critical point
KW - Distribution of minimum values
KW - Imperfection
KW - Imperfection sensitivity
KW - Limit point
KW - Pitchfork bifurcation
KW - Probability density function
KW - Random imperfection
KW - Transcritical bifurcation
UR - http://www.scopus.com/inward/record.url?scp=85073156646&partnerID=8YFLogxK
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U2 - 10.1007/978-3-030-21473-9_5
DO - 10.1007/978-3-030-21473-9_5
M3 - Chapter
AN - SCOPUS:85073156646
T3 - Applied Mathematical Sciences (Switzerland)
SP - 121
EP - 140
BT - Applied Mathematical Sciences (Switzerland)
PB - Springer
ER -