Recent progress in materials analysis by transmission electron microscopy

Recent progress of materials analysis by transmission electron microscopy was reviewed. As one of the revolutions of peripheral instruments for electron microscopy, the emergence of new recording systems such as the imaging plate system was pointed out. By combining the new recording system with computer network system, quantitative analysis of high-resolution electron microscope images and electron diffraction patterns could be carried out. In analytical electron microscopy, a new technique called ALCHEMI could be applied successfully to locating additives in various intermetallic compounds. Experimental results obtained with an omega-type energy filter were presented.