Scanning probe microscopes go video rate and beyond

M. J. Rost, L. Crama, P. Schakel, E. Van Tol, G. B.E.M. Van Velzen-Williams, C. F. Overgauw, H. Ter Horst, H. Dekker, B. Okhuijsen, M. Seynen, A. Vijftigschild, P. Han, A. J. Katan, K. Schoots, R. Schumm, W. Van Loo, T. H. Oosterkamp, J. W.M. Frenken

研究成果: Article査読

181 被引用数 (Scopus)

抄録

The features of video rate control system which can be used with any type of scanning probe microscope (SPM) are discussed. SPM control system was developed that allows high-speed scanning and data acquisition. This control system can be used for initial high tip-speed observation with existing variable temperature ultrahigh vacuum. A hybrid mode between the constant-height and constant-current modes were implemented for scanning tunneling microscopy (STM) application. It was observed that using scanner, video rate imaging speeds could reach upto 200 frames/s.

本文言語English
論文番号053710
ジャーナルReview of Scientific Instruments
76
5
DOI
出版ステータスPublished - 2005 5月
外部発表はい

ASJC Scopus subject areas

  • 器械工学

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