Simultaneous observation of nano-sized ferroelectric domains and surface morphology using scanning nonlinear dielectric microscopy

H. Odagawa, Y. Cho

研究成果: Article査読

67 被引用数 (Scopus)

抄録

A new type of scanning nonlinear dielectric microscope (SNDM), with an additional function of simultaneous observation of surface morphology, has been developed. This was achieved by using an electrically conducting atomic force microscopy cantilever as a probe needle. Using this new SNDM, simultaneous measurements of several ferroelectric materials, such as LiNbO3 single crystal and lead zirconate titanate (PZT) thin films on SrTiO3 substrates, were performed. Topographic and domain images, which were simultaneously taken from the same location on the materials, were successfully obtained. The result shows that nano-sized ferroelectric 180° c-c domains of PZT thin film having a good correlation with a topographic image were observed.

本文言語English
ページ(範囲)L621-L625
ジャーナルSurface Science
463
1
DOI
出版ステータスPublished - 2000 8月 20

ASJC Scopus subject areas

  • 凝縮系物理学
  • 表面および界面
  • 表面、皮膜および薄膜
  • 材料化学

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