抄録
We investigated a stable state of a fluorine (F) atom in Si bulk by using first-principles calculations. We considered various interstitial sites and three charge states from +1 to -1. We found that over a wide range of Fermi levels, the bond center site in the +1 charge state is the most stable for an F atom. The present calculations suggest that the experimentally observed conductivity-dependent etching properties of F for Si are intimately related to the charge-state-dependent stable site of F in the Si bulk.
本文言語 | English |
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ページ(範囲) | 595-597 |
ページ数 | 3 |
ジャーナル | Solid State Communications |
巻 | 116 |
号 | 11 |
DOI | |
出版ステータス | Published - 2000 10月 14 |
外部発表 | はい |
ASJC Scopus subject areas
- 化学 (全般)
- 凝縮系物理学
- 材料化学