Stable site and stable charge state of a fluorine atom in Si

A. Taguchi, Yoshiro Hirayama

研究成果: Article査読

8 被引用数 (Scopus)

抄録

We investigated a stable state of a fluorine (F) atom in Si bulk by using first-principles calculations. We considered various interstitial sites and three charge states from +1 to -1. We found that over a wide range of Fermi levels, the bond center site in the +1 charge state is the most stable for an F atom. The present calculations suggest that the experimentally observed conductivity-dependent etching properties of F for Si are intimately related to the charge-state-dependent stable site of F in the Si bulk.

本文言語English
ページ(範囲)595-597
ページ数3
ジャーナルSolid State Communications
116
11
DOI
出版ステータスPublished - 2000 10月 14
外部発表はい

ASJC Scopus subject areas

  • 化学 (全般)
  • 凝縮系物理学
  • 材料化学

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