TOF-SIMS imaging of polyester/melamine resin with bismuth cluster ions

S. Nishinomiya, K. Toshin, R. Shishido, S. Suzuki

研究成果: ジャーナルへの寄稿学術論文査読

3 被引用数 (Scopus)

抄録

In recent years, secondary ion mass spectrometry (SIMS) with a time-of-flight (TOF) mass analyzer has been widely used for analyzing the structures of organic molecules. In particular, TOF-SIMS with a cluster ion beam (Aun, Bin, C60, Arn, etc.) has been drawing attention as the technique can be used without destroying the structures of organic molecules. In this study, we imaged polyester/melamine resin using TOF-SIMS with bismuth cluster ions. By secondary ion imaging, we confirmed that the melamine formaldehyde resin was concentrated on the surface of the paint film. By comparing the difference between C5H7N6 + (m/z = 151) and the other ions, we estimated that the degree of condensation of the melamine formaldehyde resin increased with a catalyst.

本文言語英語
ページ(範囲)1114-1118
ページ数5
ジャーナルSurface and Interface Analysis
48
11
DOI
出版ステータス出版済み - 2016 11月 1

フィンガープリント

「TOF-SIMS imaging of polyester/melamine resin with bismuth cluster ions」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

引用スタイル