TY - JOUR
T1 - Total reflection hard x-ray photoelectron spectroscopy
T2 - Applications to strongly correlated electron systems
AU - Mizutani, T.
AU - Tanaka, S.
AU - Saze, T.
AU - Fujii, K.
AU - Matsuoka, H.
AU - Nakano, Masaki
AU - Wadati, H.
AU - Kitamura, M.
AU - Horiba, K.
AU - Iwasa, Y.
AU - Kumigashira, H.
AU - Yoshiki, M.
AU - Taguchi, M.
N1 - Funding Information:
We are grateful to Y. Takagi and A. Yasui (SPring-8, JASRI, Japan) for assistance with HAXPES measurements. The experiments at SPring-8 BL16XU and BL47XU were performed under Proposals No. 2019B5060 and No. 2019B10338. This work was supported by JSPS Grant-in-Aid for Scientific Research (Grant No. 19H05824).
Publisher Copyright:
© 2021 American Physical Society.
PY - 2021/5/7
Y1 - 2021/5/7
N2 - We demonstrate that total reflection hard x-ray photoelectron spectroscopy (TR-HAXPES) is a versatile method for elucidating a difference between surface and bulk electronic states of strongly correlated electron systems, complementing conventional bulk sensitive hard x-ray photoelectron spectroscopy (HAXPES). To demonstrate the experimental feasibility of the method, we investigated La0.6Sr0.4MnO3 and the electron-doped high-TC superconductor La1.9Ce0.1CuO4. From the incident angle dependence of the spectral line shapes, we found that the surface-sensitive TR-HAXPES measurement equivalent to soft x-ray photoelectron spectroscopy is possible in the total reflection condition. The results strongly suggest that this method allows us to measure both surface and bulk electronic states without making any changes to experimental setup such as the energy resolution, x-ray energy, and the beamline.
AB - We demonstrate that total reflection hard x-ray photoelectron spectroscopy (TR-HAXPES) is a versatile method for elucidating a difference between surface and bulk electronic states of strongly correlated electron systems, complementing conventional bulk sensitive hard x-ray photoelectron spectroscopy (HAXPES). To demonstrate the experimental feasibility of the method, we investigated La0.6Sr0.4MnO3 and the electron-doped high-TC superconductor La1.9Ce0.1CuO4. From the incident angle dependence of the spectral line shapes, we found that the surface-sensitive TR-HAXPES measurement equivalent to soft x-ray photoelectron spectroscopy is possible in the total reflection condition. The results strongly suggest that this method allows us to measure both surface and bulk electronic states without making any changes to experimental setup such as the energy resolution, x-ray energy, and the beamline.
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U2 - 10.1103/PhysRevB.103.205113
DO - 10.1103/PhysRevB.103.205113
M3 - Article
AN - SCOPUS:85106361295
SN - 2469-9950
VL - 103
JO - Physical Review B
JF - Physical Review B
IS - 20
M1 - 205113
ER -