TY - JOUR
T1 - X-ray diffraction characterization of MBE grown Pr 1-x Sr x MnO 3 thin films on NGO(1 1 0)
AU - Liu, G.
AU - Wang, H.
AU - Makino, H.
AU - Ko, H. J.
AU - Hanada, T.
AU - Yao, T.
N1 - Funding Information:
This work was supported by a Grant-in-Aid for Scientific Research Priority Area for Ministry of Education, Science, and Culture of Japan.
PY - 2002/5/8
Y1 - 2002/5/8
N2 - Oxygen plasma-assisted molecular beam epitaxial (MBE) growth of Pr 1-x Sr x MnO 3 (PSMO) thin films has been carried out on NdGaO 3 (1 1 0) (NGO) substrates. The growth parameters have been optimized to realize 2D layer-by-layer growth. XRD results of the epilayers show that the PSMO/NGO(1 1 0) thin films are of high crystal quality, as clear diffraction peaks can be observed belonging to the film and the substrate, respectively. Based on analysis of the peaks, it was concluded that epitaxial relation is PSMO(1 1 0)//NGO(1 1 0), i.e., the c-axis being parallel to the surface. Both single scans (ω scan, 2θ/ω scan) and 2-axis reciprocal space mapping (RSM) were performed in an effort to assess the crystal structure, crystalline quality, surface and interface properties of the epitaxial layers. High temperature annealing effects on lattice structure and crystal quality have been studied and discussed. Transport property measurement of the PSMO thin film samples has been carried out and main features discussed.
AB - Oxygen plasma-assisted molecular beam epitaxial (MBE) growth of Pr 1-x Sr x MnO 3 (PSMO) thin films has been carried out on NdGaO 3 (1 1 0) (NGO) substrates. The growth parameters have been optimized to realize 2D layer-by-layer growth. XRD results of the epilayers show that the PSMO/NGO(1 1 0) thin films are of high crystal quality, as clear diffraction peaks can be observed belonging to the film and the substrate, respectively. Based on analysis of the peaks, it was concluded that epitaxial relation is PSMO(1 1 0)//NGO(1 1 0), i.e., the c-axis being parallel to the surface. Both single scans (ω scan, 2θ/ω scan) and 2-axis reciprocal space mapping (RSM) were performed in an effort to assess the crystal structure, crystalline quality, surface and interface properties of the epitaxial layers. High temperature annealing effects on lattice structure and crystal quality have been studied and discussed. Transport property measurement of the PSMO thin film samples has been carried out and main features discussed.
KW - Colossal magnetoresistance
KW - NdGaO
KW - Plasma-assisted MBE
KW - PrSrMnO
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U2 - 10.1016/S0169-4332(01)00906-0
DO - 10.1016/S0169-4332(01)00906-0
M3 - Conference article
AN - SCOPUS:0037042039
SN - 0169-4332
VL - 190
SP - 408
EP - 415
JO - Applied Surface Science
JF - Applied Surface Science
IS - 1-4
T2 - Proceedings of the 8th International COnference on the form (ICFSI-8)
Y2 - 10 June 2001 through 10 June 2001
ER -