TY - JOUR
T1 - X-ray induced insulator-metal transition in a thin film of electron-doped VO2
AU - Shibuya, K.
AU - Okuyama, D.
AU - Kumai, R.
AU - Yamasaki, Y.
AU - Nakao, H.
AU - Murakami, Y.
AU - Taguchi, Y.
AU - Arima, T.
AU - Kawasaki, M.
AU - Tokura, Y.
PY - 2011/10/10
Y1 - 2011/10/10
N2 - We have observed a persistent x-ray induced insulator-metal transition at low temperature for an epitaxial film of electron-doped VO2, a material as characterized by strong electron-electron and electron-lattice interactions. The volume fraction of the photo-generated metallic patches, ranging from 0 to 100% of the whole film, can be scaled well with the total dose of x-ray irradiation, irrespective of the x-ray intensity. This indicates the monomolecular process of the insulator-metal phase conversion that corresponds to the instantaneous creation of the metallic patch extending over as many as 105 V sites per one x-ray absorbed photon. The typical percolation behavior is observed in the conductivity change with the finely photo-controlled volume ratio of the metallic phase.
AB - We have observed a persistent x-ray induced insulator-metal transition at low temperature for an epitaxial film of electron-doped VO2, a material as characterized by strong electron-electron and electron-lattice interactions. The volume fraction of the photo-generated metallic patches, ranging from 0 to 100% of the whole film, can be scaled well with the total dose of x-ray irradiation, irrespective of the x-ray intensity. This indicates the monomolecular process of the insulator-metal phase conversion that corresponds to the instantaneous creation of the metallic patch extending over as many as 105 V sites per one x-ray absorbed photon. The typical percolation behavior is observed in the conductivity change with the finely photo-controlled volume ratio of the metallic phase.
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U2 - 10.1103/PhysRevB.84.165108
DO - 10.1103/PhysRevB.84.165108
M3 - Article
AN - SCOPUS:80455124103
SN - 0163-1829
VL - 84
JO - Physical Review B - Condensed Matter and Materials Physics
JF - Physical Review B - Condensed Matter and Materials Physics
IS - 16
M1 - 165108
ER -